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A method and apparatus for locating inclusions in a diamond stone (1
211 503)
Method and System for Improved Optical Modeling of Gemstones (WO/2009/068354)
Method and Apparatus for Examining a Diamond (US 7,259,839 B2)
Method and Apparatus for Examining a Diamond
UNITED STATES PATENT Sivovolenko
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Patent. No.: |
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US 7,259,839 B2 |
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Date of Patent: |
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Aug.21, 2007 |
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Inventor: |
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Sergey B Sivovolenko, 129323 Sedova Street 13, Building 2, Room 216, Moscow |
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Assignees: |
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Garry Ian Halloway, Canterbury (AU);
Sergey B. Sivovolenko, Moscow (RU) |
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Appl. No: |
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10/861,063 |
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Filed: |
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Jun.4, 2004 |
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Abstract: |
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Prior methods of measuring diamond proportions in order to construct a complete model, such as a three dimensional virtual wire-frame model, of a diamond have been found to be inadequate. In particular, there has been no commercially available, automated and objective method for measuring the dimensions of a diamond with similar or greater accuracy that can be achieved with manual gauges or micrometers. The present invention provides a method of measuring a physical characteristic of a facet of a diamond, such as the location of one or more points on an edge of a facet. The method comprises illuminating the diamond to visually distinguish a facet from adjacent facets when viewed from a predetermined location, and then capturing an image of the diamond as viewed from this predetermined location. The image is then analyzed to determine the location of at least one point located on an edge of a facet by identifying a discontinuity in the properties of light transmitted from diamond to the viewing location. |
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